Powder evolution at low powers in silane-argon discharge
Creators
- 1. Laboratoire d'Electronique, Nanotechnologies, Capteurs (EA 3730), Universite Claude Bernard, Batiment Leon Brillouin, La Doua, 69622 Villeurbanne Cedex (France)
- 2. Laboratoire de Physique de la Matiere Condensee et Nanostructures, Unite Mixte de Recherche (UMR) 5586 Centre National de la Recherche Scientifique (CNRS), Universite Claude Bernard, Batiment Leon Brillouin, La Doua, 69622 Villeurbanne Cedex (France)
- 3. Laboratoire de Genie Electrique de Paris, Unite Mixte de Recherche (UMR) 8507 Centre National de la Recherche Scientifique (CNRS), Ecole Superieure d'Electricite, Universites Paris VI et XI, 11 rue Joliot Curie, Plateau de Moulon, 91190, Gif sur Yvette (France)
- 4. Energy Research Unit, Indian Association for the Cultivation of Science, Jadavpur, Calcutta 700032 (India)
Description
Powder formation in a 13.56-MHz radio frequency (rf) capacitive glow discharge plasma of silane-argon mixture has been studied by in situ laser light-scattering measurements. The rf power density (Prf) was varied from 18 to 53 mW/cm2. At high Prf the light scattering occurs all along the discharge and extends even beyond the exit end of the electrodes toward the pumping system. With decreasing Prf the maximum intensity of the light scattering decreases and the scattering zone shrinks and moves toward the exit end. With Prf≅20 mW/cm2 a very bright scattering zone only a few centimeters wide appears located at the electrodes outlet. The powders studied by transmission electron microscopy did not show a drastic decrease of their sizes with Prf though clear coagulation of small particles is observed at high Prf. In this paper we have tried to link the laser light-scattering evolution with Prf to various parameters such as the microstructure factor, the deposition rate, the electron mobilityxlifetime product, the density of states, and the minority-carriers diffusion length of the films in an attempt to link the effect the evolution of powder formation to the films properties
Additional details
Identifiers
- DOI
- 10.1063/1.2011778;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 98
- Journal Issue
- 4
- Journal Page Range
- p. 044913-044913.7
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37028131
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ARGON; CARRIER LIFETIME; DEPOSITION; DIFFUSION LENGTH; ELECTRON MOBILITY; GLOW DISCHARGES; LASERS; LIGHT SCATTERING; MHZ RANGE 01-100; MICROSTRUCTURE; PARTICLE SIZE; PARTICLES; PLASMA; POWDERS; POWER DENSITY; RADIOWAVE RADIATION; SILANES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- DIMENSIONS; ELECTRIC DISCHARGES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; FLUIDS; FREQUENCY RANGE; GASES; HYDRIDES; HYDROGEN COMPOUNDS; LENGTH; LIFETIME; MHZ RANGE; MICROSCOPY; MOBILITY; NONMETALS; ORGANIC COMPOUNDS; ORGANIC SILICON COMPOUNDS; PARTICLE MOBILITY; RADIATIONS; RARE GASES; SCATTERING; SILICON COMPOUNDS; SIZE
Optional Information
- Notes
- (c) 2005 American Institute of Physics