Published February 1997
| Version v1
Journal article
Rotation Sensing with an Atom Interferometer
- 1. Department of Physics and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)
Description
We have measured the phase shift induced by rotation of an atom interferometer at rates of -2 to +2 earth rates and obtained 1% agreement with the predicted Sagnac phase shift for atomic matter waves. The rotational rms noise of our interferometer was 42 milliearth rates for 1 sec of integration time, within 9% of shot noise. The high sensitivity and agreement of predicted and measured behavior suggest useful future scientific applications of atom interferometers as inertial sensors. copyright 1997 The American Physical Society
Additional details
Publishing Information
- Journal Title
- Physical Review Letters
- Journal Volume
- 78
- Journal Issue
- 5
- Journal Page Range
- p. 760-763.
- ISSN
- 0031-9007
- CODEN
- PRLTAO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28039379
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ATOMS; CESIUM; INTERFEROMETERS; NOISE; PHASE SHIFT; ROTATION; SENSITIVITY
- Descriptors DEC
- ALKALI METALS; ELEMENTS; MEASURING INSTRUMENTS; METALS