Published May 12, 1980
| Version v1
Journal article
Extended x-ray-absorption fine-structure studies of electron-lattice correlations in mixed-valence Sm/sub 0.75/Y/sub 0.25/S
- 1. Xerox Palo Alto Research Center, Palo Alto, California 94304
Description
X-ray absorption spectrum of the Sm L/sub III/ edge has been measured in mixed-valence Sm/sub 0.75/Y/sub 0.25/S. From analysis of the edge structure and extended x-ray absorption fine structure, the valence is determined and it is shown that the S neighbors of each Sm atom adopt an average distance rather than a dynamically distorted environment with two distances corresponding to the two valence states. From this it is concluded that the characteristic Sm 4f-band width is not greatly modified by polaron effects
Additional details
Publishing Information
- Journal Title
- Phys. Rev. Lett.
- Journal Volume
- 44
- Journal Issue
- 19
- Series
- Phys. Rev. Lett.
- Journal Page Range
- 1275-1278
- ISSN
- 0031-9007
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 11558074
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTRA; COUPLING; ELECTRONS; FINE STRUCTURE; HAMILTONIANS; LOW TEMPERATURE; MEDIUM TEMPERATURE; PHONONS; POLARONS; SAMARIUM SULFIDES; SYNCHROTRON RADIATION; VALENCE; X RADIATION; YTTRIUM SULFIDES
- Descriptors DEC
- BREMSSTRAHLUNG; CHALCOGENIDES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; IONIZING RADIATIONS; LEPTONS; MATHEMATICAL OPERATORS; QUANTUM OPERATORS; QUASI PARTICLES; RADIATIONS; RARE EARTH COMPOUNDS; SAMARIUM COMPOUNDS; SPECTRA; SULFIDES; SULFUR COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS