Published April 15, 2014 | Version v1
Journal article

Deep level defects in ZnO

  • 1. Institute of Electronic and Sensor Materials, TU Bergakademie Freiberg, Freiberg (Germany)
  • 2. NaMLab gGmbH, Dresden (Germany)

Description

The current understanding on intrinsic and extrinsic defects in ZnO is briefly reviewed. Special attention is given to defects defining the doping asymmetry as well as to approaches and theoretical predictions to control the conductivity of zinc oxide. Silver doping is considered a promising way to achieve hole conductivity in bulk ZnO. Results of defect spectroscopic studies on hydrothermally grown single ZnO crystals with an electron concentration of ≈1017cm−3 and ≈1014cm−3 are presented. Besides several other deep level centers in higher doped materials the Zni related level at Ec– (341±2) meV was found to be the dominating donor level in low doped ZnO. Further thermal post-treatments under inert and oxygen ambient conditions result in electrical intrinsic properties. First experiments on ZnO:Ag gave no hints for a detectable electrical activity of silver.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physb.2013.11.006

Additional details

Identifiers

DOI
10.1016/j.physb.2013.11.006;
PII
S0921-4526(13)00702-3;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
439
Journal Page Range
p. 14-19
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
5. South African conference on photonic materials
Acronym
SACPM 2013
Dates
29 Apr - 3 May 2013
Place
Kariega Game Reserve (South Africa)

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.