Published 2014 | Version v1
Journal article

Characterization of the PANDA MVD trapezoidal silicon strip sensors and the development of their readout system

  • 1. Forschungszentrum Juelich GmbH (Germany)

Description

The anti PANDA-experiment will be one of the main experiments inside the upcoming Facility for Antiproton and Ion Research (FAIR) at the GSI in Darmstadt. The fixed target experiment will explore bar pp annihilation in the charm mass region with intense, phase space cooled beams with momenta between 1.5 and 15 GeV/c. The innermost subdetector of anti PANDA will be the Micro Vertex Detector (MVD) and consists of silicon strip and pixel detectors. In order to operate and test the first trapezoidal strip sensor prototypes of the MVD, they are characterized with a probestation as well as with a dedicated testboard. Furthermore, the existing Juelich Digital Readout System has to be modified for the trapezoidal sensors. In this poster the adaption of the Juelich Digital Readout System for the trapezoidal silicon strip sensors as well as their characterization are presented.

Additional details

Publishing Information

Journal Title
Verhandlungen der Deutschen Physikalischen Gesellschaft
Journal Issue
Frankfurt 2014 issue
Series
Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 49(1)
Journal Page Range
[1 p.]
ISSN
0420-0195
CODEN
VDPEAZ

Conference

Title
2014 DPG Spring meeting with the divisions of physics education and physics of hadrons and nuclei. Industry- and book exhibition
Original Conference Title
DPG-Fruehjahrstagung 2014 der Fachverbaende Didaktik der Physik, Physik der Hadronen und Kerne. Industrie- und Buchausstellung
Dates
17-21 Mar 2014
Place
Frankfurt am Main (Germany)

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
46106049
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DIGITAL SYSTEMS; PARTICLE TRACKS; POSITION SENSITIVE DETECTORS; READOUT SYSTEMS; SI MICROSTRIP DETECTORS
Descriptors DEC
MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS

Optional Information

Notes
Session: HK 46.91 Do 16:00; No further information available
Collaborations
PANDA-Collaboration