Characterization of the PANDA MVD trapezoidal silicon strip sensors and the development of their readout system
- 1. Forschungszentrum Juelich GmbH (Germany)
Description
The anti PANDA-experiment will be one of the main experiments inside the upcoming Facility for Antiproton and Ion Research (FAIR) at the GSI in Darmstadt. The fixed target experiment will explore bar pp annihilation in the charm mass region with intense, phase space cooled beams with momenta between 1.5 and 15 GeV/c. The innermost subdetector of anti PANDA will be the Micro Vertex Detector (MVD) and consists of silicon strip and pixel detectors. In order to operate and test the first trapezoidal strip sensor prototypes of the MVD, they are characterized with a probestation as well as with a dedicated testboard. Furthermore, the existing Juelich Digital Readout System has to be modified for the trapezoidal sensors. In this poster the adaption of the Juelich Digital Readout System for the trapezoidal silicon strip sensors as well as their characterization are presented.
Additional details
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Frankfurt 2014 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 49(1)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- 2014 DPG Spring meeting with the divisions of physics education and physics of hadrons and nuclei. Industry- and book exhibition
- Original Conference Title
- DPG-Fruehjahrstagung 2014 der Fachverbaende Didaktik der Physik, Physik der Hadronen und Kerne. Industrie- und Buchausstellung
- Dates
- 17-21 Mar 2014
- Place
- Frankfurt am Main (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 46106049
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DIGITAL SYSTEMS; PARTICLE TRACKS; POSITION SENSITIVE DETECTORS; READOUT SYSTEMS; SI MICROSTRIP DETECTORS
- Descriptors DEC
- MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS
Optional Information
- Notes
- Session: HK 46.91 Do 16:00; No further information available
- Collaborations
- PANDA-Collaboration