A gas sensor based on Ga-doped SnO2 porous microflowers for detecting formaldehyde at low temperature
Creators
- 1. College of Physics, State Key Laboratory of Superhard Materials, Jilin University, Changchun 130012 (China)
- 2. Dehui Secondary Vocational and Technical School, Changchun 130300 (China)
- 3. School of Materials Science and Engineering, Changchun University of Science and Technology, Changchun 130013 (China)
Description
Highlights: • Undoped and Ga-doped SnO2 porous microflowers were synthesized. • The existence of Ga and porous structure of as-synthesized materials were proved. • Ga-doped SnO2 porous microflowers sensor owns high performance to formaldehyde. Ga-doped and undoped SnO2 porous microflowers (SPMs) were synthesized by a facile hydrothermal method. The presence of Ga in the SPMs and their structure was determined by X-ray powder diffraction (XRD), energy-dispersive spectroscopy (EDS), X-ray photoelectric spectroscopy (XPS) and scanning electron microscopy (SEM). Compared with the pure SPM sensor, the 3 wt% Ga-doped SPM sensor exhibits a lower detection limit (3.0/0.1 ppm) and improved sensitivity (95.8/50 ppm) to formaldehyde at 230 °C, which is 4.5 times greater than the pure SPM sensor (21.2/50 ppm). Furthermore, the Ga-doped sensor shows a short response-recovery time (3/39 s) and good selectivity for formaldehyde.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.cplett.2018.10.052Additional details
Identifiers
- DOI
- 10.1016/j.cplett.2018.10.052;
- PII
- S0009261418308728;
Publishing Information
- Journal Title
- Chemical Physics Letters
- Journal Volume
- 713
- Journal Page Range
- p. 235-241
- ISSN
- 0009-2614
- CODEN
- CHPLBC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53001975
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DOPED MATERIALS; HYDROTHERMAL SYNTHESIS; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; SENSITIVITY; SENSORS; TIN OXIDES; X RADIATION; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; IONIZING RADIATIONS; MATERIALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; SCATTERING; SPECTROSCOPY; SYNTHESIS; TIN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2018 Published by Elsevier B.V.