Published June 1993
| Version v1
Journal article
Scanning x-ray microscopy using a laser-plasma source
Creators
- 1. Physics Department, King's College, Strand, London WC2R 2LS (United Kingdom)
- 2. Central Laser Facility, Rutherford Appleton Laboratory, Chilton, Didcot, Oxon OX11 0QX (United Kingdom)
Description
Previously high-resolution soft x-ray microscopy has only been possible with synchrotron sources. Here, the first successful attempts at using a scanning transmission x-ray microscope with a laser-plasma source are reported. Spatial resolutions were limited to about 650 nm by electrical noise in the detector, but single shot per pixel images were obtained of test and real specimens. The microscope was not optimized to the source since it was designed for use on the undulator beam line of a synchrotron. With an improved system, it is demonstrated that single shot per pixel imaging at high resolution (better than 50 nm) will routinely be possible
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 64
- Journal Issue
- 6
- Journal Page Range
- p. 1478-1482.
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 25036879
- Subject category
- S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- DESIGN; MICROSCOPES; OPERATION; RESOLUTION; SOFT X RADIATION; SYNCHROTRON RADIATION SOURCES
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATION SOURCES; RADIATIONS; X RADIATION