Published June 1993 | Version v1
Journal article

Scanning x-ray microscopy using a laser-plasma source

  • 1. Physics Department, King's College, Strand, London WC2R 2LS (United Kingdom)
  • 2. Central Laser Facility, Rutherford Appleton Laboratory, Chilton, Didcot, Oxon OX11 0QX (United Kingdom)

Description

Previously high-resolution soft x-ray microscopy has only been possible with synchrotron sources. Here, the first successful attempts at using a scanning transmission x-ray microscope with a laser-plasma source are reported. Spatial resolutions were limited to about 650 nm by electrical noise in the detector, but single shot per pixel images were obtained of test and real specimens. The microscope was not optimized to the source since it was designed for use on the undulator beam line of a synchrotron. With an improved system, it is demonstrated that single shot per pixel imaging at high resolution (better than 50 nm) will routinely be possible

Additional details

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
64
Journal Issue
6
Journal Page Range
p. 1478-1482.
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
25036879
Subject category
S43: PARTICLE ACCELERATORS;
Descriptors DEI
DESIGN; MICROSCOPES; OPERATION; RESOLUTION; SOFT X RADIATION; SYNCHROTRON RADIATION SOURCES
Descriptors DEC
ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATION SOURCES; RADIATIONS; X RADIATION