Electrical and optical characterization of Os-substituted rare-earth orthoferrite YbFeO powders
- 1. Institute of Physical Engineering, Brno University of Technology (Czech Republic)
- 2. CEITEC BUT, Brno University of Technology (Czech Republic)
- 3. Department of Engineering Physics, Faculty of Engineering and Natural Sciences, Istanbul Medeniyet University (Turkey)
- 4. Department of Physics, Faculty of Electrical Engineering and Communication, Brno University of Technology (Czech Republic)
- 5. Department of Pharmaceutical Chemistry, Faculty of Pharmacy, Bezmialem Vakif University, Fatih, İstanbul (Turkey)
- 6. Department of Physics, Faculty of Science, Eskisehir Technical University (Turkey)
Description
The electrical properties of Os-doped YbFeO (YbFO) powders prepared by solid-state reaction have been studied by Impedance Spectrometer/Impedance Spectrometer. SEM, XPS and Raman spectroscopy were utilized for understanding chemical and structured analysis of the synthesized compounds. SEM images have revealed the void nature of the pellets. Furthermore, XPS studies have exhibited that Yb has 3 + valance state. It is also revealed that the oxygen vacancies concentration drops as the Os doping level raises by XPS analysis. The frequency dependency of loss-tan(δ) examination has demonstrated that the 5 mol% Os-substituted sample has the lowest loss-tan(δ) values at high frequency regions at 100 °C. It has been also realized that the 5 mol% Os-doped compound exhibits the highest resistivity among the samples. Raman spectroscopy examination has unveiled that the samples have similar space group. In addition, the optical band gap of the synthesized powders was also extracted via utilizing the Kubelka–Munk technique. It was realized that the band gap of YbFO slightly increases as the Os dopant ratio advances.
Availability note (English)
Available from: http://dx.doi.org/10.1007/s00339-020-04182-1Additional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing (Print)
- Journal Volume
- 127
- Journal Issue
- 1
- Journal Page Range
- p. 1-11
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 52041627
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DOPED MATERIALS; IMPEDANCE; IRON OXIDES; OSMIUM; OXYGEN; RAMAN SPECTROSCOPY; RARE EARTHS; SCANNING ELECTRON MICROSCOPY; SPACE GROUPS; SPECTROMETERS; TANTALUM NITRIDES; VACANCIES; X-RAY PHOTOELECTRON SPECTROSCOPY; YTTERBIUM COMPOUNDS
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; IRON COMPOUNDS; LASER SPECTROSCOPY; MATERIALS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PLATINUM METALS; PNICTIDES; POINT DEFECTS; RARE EARTH COMPOUNDS; REFRACTORY METAL COMPOUNDS; REFRACTORY METALS; SPECTROSCOPY; SYMMETRY GROUPS; TANTALUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- AID: 19