Published June 1996
| Version v1
Journal article
Polarization-dependent extended x-ray absorption fine structure measurements of metastable fcc Co on (100) diamond
- 1. Naval Research Laboratory, Washington, DC 20375 (United States)
Description
Polarization-dependent extended x-ray absorption fine structure (EXAFS) measurements have been made on a single-crystal 1000 A thick Co film deposited on (100) diamond. By comparing the EXAFS signals corresponding to the in-plane and out-of-plane structure relative to the film plane, we clearly illustrate that the film exists in the face centered cubic (fcc) phase. An analysis of the first shell Fourier transform peaks for the in-plane and out-of-plane structure surrounding the Co atoms indicates that the majority of the fcc Co crystal lattice is not distorted, demonstrating that the majority of film is relaxed and not pseudomorphic. copyright 1996 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 68
- Journal Issue
- 24
- Journal Page Range
- p. 3389-3391.
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27074095
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; COBALT; DEPOSITION; DIAMONDS; MICROSTRUCTURE; MORPHOLOGY; PHASE STUDIES; THIN FILMS; X-RAY SPECTROSCOPY
- Descriptors DEC
- CARBON; CRYSTAL STRUCTURE; ELEMENTS; FILMS; METALS; MINERALS; NONMETALS; SPECTROSCOPY; TRANSITION ELEMENTS