Published 1994
| Version v1
Journal article
X-ray diffraction study of texture evolution in electrodeposited zinc layers
Description
An X-Ray diffraction method for the monitoring of texture evolution in electrodeposited and vapor-deposited layers was developed. It was applied to the study of zinc deposits. An information was obtained for the effect of amorphous substrate on the texture formation in samples deposited under equal conditions. (orig.)
Additional details
Publishing Information
- Journal Title
- Materials Science Forum
- Journal Volume
- 157-162
- Journal Issue
- pt.2
- Journal Page Range
- p. 1495-1500.
- ISSN
- 0255-5476
- CODEN
- MSFOEP
Conference
- Title
- 10. international conference on textures of materials (ICOTOM-10).
- Dates
- 20-24 Sep 1993.
- Place
- Clausthal-Zellerfeld (Germany).
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 26004946
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMORPHOUS STATE; CHEMICAL VAPOR DEPOSITION; DIFFRACTION METHODS; ELECTRODEPOSITION; GRAIN GROWTH; GRAIN ORIENTATION; LAYERS; SUBSTRATES; TEXTURE; THICKNESS; X-RAY DIFFRACTION; ZINC
- Descriptors DEC
- CHEMICAL COATING; COHERENT SCATTERING; CRYSTAL STRUCTURE; DEPOSITION; DIFFRACTION; DIMENSIONS; ELECTROLYSIS; ELEMENTS; METALS; MICROSTRUCTURE; ORIENTATION; SCATTERING; SURFACE COATING