X-ray imaging crystal spectroscopy for use in plasma transport research
Creators
- 1. MIT-Plasma Science and Fusion Center, Cambridge, Massachusetts 02139 (United States)
- 2. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543 (United States)
Description
This research describes advancements in the spectral analysis and error propagation techniques associated with x-ray imaging crystal spectroscopy (XICS) that have enabled this diagnostic to be used to accurately constrain particle, momentum, and heat transport studies in a tokamak for the first time. Doppler tomography techniques have been extended to include propagation of statistical uncertainty due to photon noise, the effect of non-uniform instrumental broadening as well as flux surface variations in impurity density. These methods have been deployed as a suite of modeling and analysis tools, written in interactive data language (IDL) and designed for general use on tokamaks. Its application to the Alcator C-Mod XICS is discussed, along with novel spectral and spatial calibration techniques. Example ion temperature and radial electric field profiles from recent I-mode plasmas are shown, and the impact of poloidally asymmetric impurity density and natural line broadening is discussed in the context of the planned ITER x-ray crystal spectrometer.
Additional details
Identifiers
- DOI
- 10.1063/1.4758281;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 83
- Journal Issue
- 11
- Journal Page Range
- p. 113504-113504.12
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44052385
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALCATOR DEVICE; ASYMMETRY; CALIBRATION; CRYSTALS; DENSITY; DOPPLER BROADENING; ELECTRON TEMPERATURE; HEAT TRANSFER; ION TEMPERATURE; ITER TOKAMAK; MAGNETIC SURFACES; PLASMA DENSITY; PLASMA DIAGNOSTICS; PLASMA IMPURITIES; SIMULATION; SPECTROMETERS; SPECTROSCOPY; X RADIATION; X-RAY SOURCES
- Descriptors DEC
- CLOSED PLASMA DEVICES; ELECTROMAGNETIC RADIATION; ENERGY TRANSFER; IMPURITIES; IONIZING RADIATIONS; LINE BROADENING; MAGNETIC FIELD CONFIGURATIONS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; RADIATION SOURCES; RADIATIONS; THERMONUCLEAR DEVICES; THERMONUCLEAR REACTORS; TOKAMAK DEVICES; TOKAMAK TYPE REACTORS
Optional Information
- Notes
- (c) 2012 American Institute of Physics