Published November 2012 | Version v1
Journal article

X-ray imaging crystal spectroscopy for use in plasma transport research

  • 1. MIT-Plasma Science and Fusion Center, Cambridge, Massachusetts 02139 (United States)
  • 2. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543 (United States)

Description

This research describes advancements in the spectral analysis and error propagation techniques associated with x-ray imaging crystal spectroscopy (XICS) that have enabled this diagnostic to be used to accurately constrain particle, momentum, and heat transport studies in a tokamak for the first time. Doppler tomography techniques have been extended to include propagation of statistical uncertainty due to photon noise, the effect of non-uniform instrumental broadening as well as flux surface variations in impurity density. These methods have been deployed as a suite of modeling and analysis tools, written in interactive data language (IDL) and designed for general use on tokamaks. Its application to the Alcator C-Mod XICS is discussed, along with novel spectral and spatial calibration techniques. Example ion temperature and radial electric field profiles from recent I-mode plasmas are shown, and the impact of poloidally asymmetric impurity density and natural line broadening is discussed in the context of the planned ITER x-ray crystal spectrometer.

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
83
Journal Issue
11
Journal Page Range
p. 113504-113504.12
ISSN
0034-6748
CODEN
RSINAK

Optional Information

Notes
(c) 2012 American Institute of Physics