Published January 1999 | Version v1
Miscellaneous

Computational methods of approaching the inverse problem for electron diffraction

Description

This thesis describes four distinct computational approaches for retrieving information from Convergent Electron Beam Diffraction (CBED) patterns. Firstly, phase retrieval techniques have been used to invert one dimensional rocking curves to obtain strain profiles. The inherent problems of multiple minima are outlined and it is demonstrated how these may be overcome in certain cases. Using this technique, experimental rocking curves from inclined ion-thinned and chemically thinned samples have been inverted and it has been shown that ion thinning does indeed induce dilation of surface layers, attributable to Ar implantation. Secondly the Zone Axis Pattern matching (ZAPMATCH) technique has been used to refine the low order x-ray structure factors of Ni, Cu and Cr. It has been demonstrated that the ZAPMATCH routine can be successfully applied to metallic samples, and the structure factors measured are in good agreement with other published values. Recent advances in the area of blind deconvolution have been rapid and we have attempted to apply a recent advance to a deconvolute a simulated CBED disc. It has been demonstrated that it is not possible to use current techniques on experimental data. Finally a new method for quantitatively assessing symmetry breaking in experimental images has been developed and its use has been demonstrated on a variety of different data sets. (author)

Availability note (English)

Available from British Library Document Supply Centre- DSC:DXN024044

Additional details

Publishing Information

Imprint Pagination
[np]

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
30031049
Subject category
S99: GENERAL AND MISCELLANEOUS;
Resource subtype / Literary indicator
Numerical Data, Thesis, Non-conventional Literature
Descriptors DEI
CALCULATION METHODS; ELECTRON BEAMS; ELECTRON DIFFRACTION; EXPERIMENTAL DATA; SURFACES
Descriptors DEC
BEAMS; COHERENT SCATTERING; DATA; DIFFRACTION; INFORMATION; LEPTON BEAMS; NUMERICAL DATA; PARTICLE BEAMS; SCATTERING