Published December 2018 | Version v1
Journal article

Photoemission response of 2D electron states

Creators

  • 1. Swiss Light Source, Paul Scherrer Institute, Villigen-PSI, CH-5232 (Switzerland)

Description

Highlights: • A Fourier-analysis based description to the photoemission process is presented. • Photon-energy dependent photoemission response of 2D electron states reflects Fourier composition and confinement of their wavefunctions. • Previous photoemission results on surface, quantum well and molecular orbital states are revisited in terms of wavefunction analysis. - Abstract: A lucid Fourier analysis based description of the photoemission process is presented that directly relates photon energy (hv) dependent ARPES response of two-dimensional (2D) electron states to their wavefunctions. The states formed by quantum confinement of bulk Bloch waves (including Shockley-Tamm type surface or interface states, and quantum well states) show periodic peaks of ARPES intensity as a function of hv. Amplitudes of these peaks reflect Fourier series of the oscillating Bloch-wave component of the wavefunction, and their broadening the spatial confinement of its envelope function. In contrast, the 2D states formed by local orbitals (dangling bonds and defects at the surface or interface) show aperiodic hv-dependence, where the rate of decay reflects localization of these states in the out-of-plane direction. This formalism sets up a straightforward methodology to access fundamental properties of different 2D states, as illustrated by analysis of previous photoemission experimental data including the paradigm Al(100) surface state, quantum-well states in multilayer graphene and at the buried GaAlN/GaN interface, and molecular orbitals.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2018.09.001

Additional details

Identifiers

DOI
10.1016/j.elspec.2018.09.001;
PII
S0368204818300860;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
229
Journal Page Range
p. 100-107
ISSN
0368-2048
CODEN
JESRAW

Optional Information

Notes
© 2018 Elsevier B.V. All rights reserved.