Published February 1990
| Version v1
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Application of SR to ultra trace analysis
Description
Various limitations in ultra trace analysis are discussed and possibilities of overcoming these difficulties by SR are explained. Several applications are shown in bulk analysis, total reflection analysis and surface or depth analysis. (author)
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Additional details
Additional titles
- Original title (Japanese)
- Ogata hoshako shisetsu keikaku to sentan kagaku gijutsu, koen yoshi.
Publishing Information
- Imprint Title
- The international symposium on 'X-ray synchrotron radiation and advanced science and technology'
- Imprint Pagination
- 200 p.
- Journal Page Range
- p. 83-90.
- Report number
- INIS-mf--12644
Conference
- Title
- International symposium on 'X-ray synchrotron radiation and advanced science and technology'.
- Dates
- 15-16 Feb 1990.
- Place
- Kobe (Japan).
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 21085861
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DEPTH; FILMS; MICROANALYSIS; REFLECTION; SURFACES; SYNCHROTRON RADIATION; TRACE AMOUNTS
- Descriptors DEC
- BREMSSTRAHLUNG; DIMENSIONS; ELECTROMAGNETIC RADIATION; RADIATIONS
Optional Information
- Notes
- Imprint:Ogata hoshako shisetsu keikaku to sentan kagaku gijutsu, koen yoshi.