Published March 7, 2012 | Version v1
Journal article

An inter-laboratory comparison of EPMA analysis of alloy steel at low voltage

  • 1. University of Barcelona, Centres Científics i Tecnològics (CCiT), C/ Lluís Solé i Sabarís 1-3, ES-08028 Barcelona (Spain)
  • 2. Aalto University, Department of Materials Science and Engineering, PO Box 16200, FI-00076 Aalto, Espoo (Finland)
  • 3. Acerinox S.A., Departamento I-D-i, Pol. Industrial Palmones s/n, ES-11319 Los Barrios (Spain)
  • 4. Université de Montpellier II, CNRS, Laboratoire Géosciences Montpellier, Place Eugène Bataillon, FR-34095 Montpellier Cedex 5 (France)
  • 5. RWTH Aachen University, GFE - Central Facility for Electron Microscopy, Ahornstrasse 55, DE-52074 Aachen (Germany)
  • 6. University of Wisconsin, Department of Geoscience, 1215 West Dayton Street, US-53706 Madison, Wisconsin (United States)
  • 7. Tata Steel Europe, RD and T, Ceramic Research Centre, PO Box 10.000, NL-1970 CA IJmuiden (Netherlands)

Description

We present the results of an inter-laboratory comparison of EPMA analysis at low voltage (5-6 kV) of three monophasic alloy steel samples. The aim of the work was to obtain an estimate of the present situation of low-voltage analysis of steel and identify needs for improvement. EPMA analyses of the samples were conducted by seven participant groups using electron microprobes and scanning electron microscopes of different kind, equipped with wavelength- and/or energy-dispersive X-ray spectrometers, and employing their own methodology of analysis. The results using WDS showed essentially an underestimation of the Cr contents, with relative deviations from the reference values ranging from -0.7 % to -17 %, and an overestimation of Fe and Ni, with relative deviations from the reference composition ranging from -4 % to +30 %, and from +14 % to +42 %, respectively. The relative deviations obtained by using EDS showed larger scatter, ranging from -16 % to +54 % for Cr, -0.4 % to +66 % for Fe and from +13 % to +90 % for Ni. Reasons for the differences observed and the scatter of results are discussed.

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/32/1/012014

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
32
Journal Issue
1
Journal Page Range
[14 p.]
ISSN
1757-899X

Conference

Title
12. European workshop on modern developments in microbeam analysis
Acronym
EMAS 2011
Dates
15-19 May 2011
Place
Angers (France)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43100812
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRIC POTENTIAL; ELECTRON MICROPROBE ANALYSIS; ELECTRONS; INTERLABORATORY COMPARISONS; SCANNING ELECTRON MICROSCOPY; STEELS; X-RAY SPECTROMETERS
Descriptors DEC
ALLOYS; CARBON ADDITIONS; CHEMICAL ANALYSIS; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; FERMIONS; IRON ALLOYS; IRON BASE ALLOYS; LEPTONS; MEASURING INSTRUMENTS; MICROANALYSIS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; SPECTROMETERS; TRANSITION ELEMENT ALLOYS