Published December 14, 2012 | Version v1
Journal article

Structural and electrical characterization of ultra-thin SrTiO3 tunnel barriers grown over YBa2Cu3O7 electrodes for the development of high Tc Josephson junctions

  • 1. Centro Atómico Bariloche, Instituto Balseiro—CNEA, Universidad Nacional de Cuyo, Avenida Bustillo 9500, 8400 Bariloche, Rio Negro (Argentina)
  • 2. Universidad de Concepción, Victoria 631, 2613 Concepción (Chile)
  • 3. Consejo Nacional de Investigaciones Científicas y Técnicas, Avenida Rivadavia 1917 C1033AAJ CABA (Argentina)
  • 4. Unité Mixte de Physique CNRS/THALES, Université Paris Sud 11, F-91767 Palaiseau Cedex (France)
  • 5. Laboratoire de Physique et d'Etude des Matériaux, UMR8213/CNRS, ESPCI ParisTech, 10 rue Vauquelin, Paris F-75005 (France)
  • 6. LPN-CNRS, Route de Nozay, F-91460 Marcoussis (France)

Description

The transport properties of ultra-thin SrTiO3 (STO) layers grown over YBa2Cu3O7 electrodes were studied by conductive atomic force microscopy at the nano-scale. A very good control of the barrier thickness was achieved during the deposition process. A phenomenological approach was used to obtain critical parameters regarding the structural and electrical properties of the system. The STO layers present an energy barrier of 0.9 eV and an attenuation length of 0.23 nm, indicating very good insulating properties for the development of high-quality Josephson junctions. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/23/49/495715

Additional details

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
23
Journal Issue
49
Journal Page Range
[6 p.]
ISSN
0957-4484