Published 2002
| Version v1
Miscellaneous
AlN films produced by reactive pulse plasma method as dielectric for Si and SiC substrates
- 1. Institute of Microelectronics, Warsaw Universiy of Technology, Warsaw (Poland)
- 2. Faculty of Materials Science and Engineering, Warsaw University of Technology, Warsaw (Poland)
Description
no abstract available
Additional details
Publishing Information
- Imprint Title
- Abstracts of International Symposium Ion Implantation and Other Applications of Ions and Electrons, ION 2002
- Imprint Pagination
- 174 p.
- Journal Page Range
- p. 87
Conference
- Title
- 4. International Symposium Ion Implantation and Other Applications of Ions and Electrons, ION 2002
- Dates
- 10-13 Jun 2002
- Place
- Kazimierz Dolny (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 34075148
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- ALUMINIUM NITRIDES; CAPACITANCE; CHEMICAL COMPOSITION; CRYSTAL STRUCTURE; DIELECTRIC MATERIALS; ELECTRIC CONDUCTIVITY; ELLIPSOMETRY; LAYERS; MASS SPECTROSCOPY; MICROELECTRONICS; PLASMA; PULSE TECHNIQUES; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON CARBIDES; SUBSTRATES; THICKNESS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CARBIDES; CARBON COMPOUNDS; DIMENSIONS; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; MATERIALS; MEASURING METHODS; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; PHYSICAL PROPERTIES; PNICTIDES; SEMIMETALS; SILICON COMPOUNDS; SPECTROSCOPY
Optional Information
- Notes
- 2 refs, 1 fig.