Published November 2016 | Version v1
Journal article

Progress in structure recovery from low dose exposures: Mixed molecular adsorption, exploitation of symmetry and reconstruction from the minimum signal level

Description

We investigate the recovery of structures from large-area, low dose exposures that distribute the dose over many identical copies of an object. The reconstruction is done via a maximum likelihood approach that does neither require to identify nor align the individual particles. We also simulate small molecular adsorbates on graphene and demonstrate the retrieval of images with atomic resolution from large area and extremely low dose raw data. Doses as low as 5 e2 are sufficient if all symmetries (translations, rotations and mirrors) of the supporting membrane are exploited to retrieve the structure of individual adsorbed molecules. We compare different optimization schemes, consider mixed molecules and adsorption sites, and requirements on the amount of data. We further demonstrate that the maximum likelihood approach is only count limited by requiring at least three independent counts per entity. Finally, we demonstrate that the approach works with real experimental data and in the presence of aberrations.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2016.08.009

Additional details

Identifiers

DOI
10.1016/j.ultramic.2016.08.009;
arXiv
arXiv:1803.09657v1;
PII
S0304-3991(16)30120-6;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
170
Journal Page Range
p. 60-68
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48085954
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ADSORPTION; COMPARATIVE EVALUATIONS; DOSES; ELECTRON MICROSCOPY; GRAPHENE; IMAGES; MAXIMUM-LIKELIHOOD FIT; MEMBRANES; MIRRORS; MOLECULES; OPTIMIZATION; PARTICLES; RADIATION EFFECTS; RESOLUTION; SIGNALS; SYMMETRY
Descriptors DEC
CARBON; ELEMENTS; EVALUATION; MATHEMATICAL SOLUTIONS; MICROSCOPY; NONMETALS; NUMERICAL SOLUTION; SORPTION

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.