Published February 1, 1984
| Version v1
Journal article
Quantitative X-ray phase analysis of surface layers
Creators
- 1. Ben-Gurion Univ. of the Negev, Beersheba (Israel)
Description
The proposed method is aimed at the analysis of phase distribution in thin surface layers comparable to the penetration depth of X-rays. The phase distribution is modelled mathematically and the parameters of the distribution are evaluated from diffraction data taken for various peaks and with various radiations. The method was applied to the analysis of austenite distribution in cathodically charged stainless steel. (Auth.)
Additional details
Publishing Information
- Journal Title
- J. Appl. Crystallogr.
- Journal Volume
- 17
- Journal Issue
- 1
- Series
- J. Appl. Crystallogr.
- Journal Page Range
- 18-21
- ISSN
- 0021-8898
INIS
- Country of Publication
- Denmark
- Country of Input or Organization
- Denmark
- INIS RN
- 15035299
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- LAYERS; PHASE TRANSFORMATIONS; QUANTITATIVE CHEMICAL ANALYSIS; STEEL-CR18NI10TI; SURFACES; THICKNESS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; AUSTENITIC STEELS; CARBON ADDITIONS; CHEMICAL ANALYSIS; CHROMIUM ALLOYS; CHROMIUM-NICKEL STEELS; COHERENT SCATTERING; CORROSION RESISTANT ALLOYS; DIFFRACTION; DIMENSIONS; HEAT RESISTING ALLOYS; HIGH ALLOY STEELS; IRON ALLOYS; IRON BASE ALLOYS; NICKEL ALLOYS; SCATTERING; STAINLESS STEELS; STEELS; TITANIUM ADDITIONS