Micrometer-scale WS2 atomic layers grown by alkali metal free gas-source chemical vapor deposition with H2S and WF6 precursors
Creators
- 1. National Institute of Advanced Industrial Science and Technology (AIST), Nanomaterials Research Institute, Tsukuba, Ibaraki (Japan)
- 2. National Institute of Advanced Industrial Science and Technology (AIST), Device Technology Research Institute, Tsukuba, Ibaraki (Japan)
Description
Scalable chemical vapor deposition (CVD) of two-dimensional semiconducting materials such as MoS2 and WS2 is a key technology for the application of these materials in real devices. In this work, we demonstrate the growth behavior of WS2 crystals from gaseous precursors, i.e. H2S and WF6, under alkali-metal-free conditions. The WS2 crystal growth exhibits layer-by-layer growth, and its behaviors, such as nucleation and lateral growth, are a thermally activated process: the temperature-dependent grain size and density are well fitted by the Arrhenius equation. The obtained WS2 crystal shows quality comparable to that obtained from metal oxides: the WS2 film shows sharp photoluminescence with a peak width of 54 meV and n-type field-effect transistor operation. Optimizing the growth conditions enabled us to obtain WS2 crystals with a grain size of ∼1.5 μm, which is the largest size ever reported for a transition-metal dichalcogenide grown by gas-source CVD without an alkali-metal promotor. (author)
Availability note (English)
Available from DOI: https://doi.org/10.35848/1347-4065/abd6d6Additional details
Identifiers
Publishing Information
- Journal Title
- Japanese Journal of Applied Physics (Online)
- Journal Volume
- 60
- Journal Issue
- SB
- Journal Page Range
- p. SBBH09.1-SBBH09.6
- ISSN
- 1347-4065
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 53074148
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; ELECTRIC CONDUCTIVITY; ELECTRON BEAMS; FIELD EFFECT TRANSISTORS; GRAIN SIZE; HYDROGEN SULFIDES; MOLYBDENUM SULFIDES; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SILICON OXIDES; TUNGSTEN SULFIDES
- Descriptors DEC
- BEAMS; CHALCOGENIDES; CHEMICAL COATING; DEPOSITION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; EMISSION; HYDROGEN COMPOUNDS; LEPTON BEAMS; LUMINESCENCE; MATERIALS; MICROSCOPY; MICROSTRUCTURE; MOLYBDENUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PHOTON EMISSION; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; SEMICONDUCTOR DEVICES; SILICON COMPOUNDS; SIZE; SULFIDES; SULFUR COMPOUNDS; SURFACE COATING; TRANSISTORS; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS
Optional Information
- Notes
- 35 refs., 12 figs., 1 tab.