Published August 13, 2001
| Version v1
Journal article
Collective emission degradation behavior of carbon nanotube thin-film electron emitters
Description
The current-induced emission degradation of a carbon nanotube (CNT) thin-film electron emitter is studied under constant emission current for different current levels, using a scanning anode field emission microscope. A permanent emission degradation is observed for emission currents higher than 300 nA per CNT and is associated with resistive heating at the CNT--substrate interface for the sample under investigation. A second field-induced emission degradation mechanism, associated with the removal of CNTs from the substrate, is also reported. Copyright 2001 American Institute of Physics
Additional details
Identifiers
- DOI
- 10.1063/1.1392982;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 79
- Journal Issue
- 7
- Journal Page Range
- p. 1036-1038
- ISSN
- 0003-6951
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 32052789
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CARBON; FIELD EMISSION; FULLERENES; MICROSCOPY; MICROSTRUCTURE; THIN FILMS
- Descriptors DEC
- CARBON; ELEMENTS; EMISSION; FILMS; NONMETALS
Optional Information
- Notes
- Othernumber: APPLAB000079000007001036000001; 024133APL
- Funding organization
- United States (United States)