Microstructure and mechanical properties of nanoscale Cu/Ni multilayers
Creators
- 1. National Key Lab for Remanufacturing, Academy of Armored Forces Engineering, Beijing 100072 (China)
- 2. Laboratory of Advanced Materials, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084 (China)
Description
The microstructure, hardness and creep behavior of Cu/Ni multilayers were investigated by X-ray diffraction, transmission electron microscopy and nanoindentation. The results show that the multilayers with a good modulation structure formed coherent superlattice at low periodicity. The strength increases as the periodicity falls from 17.5 nm to 7.0 nm, which can be well described by a CLS model. After that, the strength reaches a peak value of 2.53 GPa at the smallest periodicity of 3.5 nm. This value approximately equals to the theoretical peak strength predicted by a coherent stresses model. The stress exponent extracted from nanoindentation creep test varies from 2.20 to 6.87, indicating a dislocation glide-climb creep mechanism. The variation in the stress exponent with decreasing periodicity is discussed and ascribed to a change of the dominating rate from climb-controlled to eventually glide-controlled events.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.msea.2009.09.058Additional details
Identifiers
- DOI
- 10.1016/j.msea.2009.09.058;
- PII
- S0921-5093(09)01107-1;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 527
- Journal Issue
- 4-5
- Journal Page Range
- p. 1243-1248
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44010039
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COPPER; CREEP; DISLOCATIONS; HARDNESS; INTERFACES; LAYERS; MICROSTRUCTURE; MODULATION; NANOSTRUCTURES; NITROGEN; PERIODICITY; PRESSURE RANGE GIGA PA; STRESSES; SUPERLATTICES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; YIELD STRENGTH
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; LINE DEFECTS; MECHANICAL PROPERTIES; METALS; MICROSCOPY; NONMETALS; PRESSURE RANGE; SCATTERING; TRANSITION ELEMENTS; VARIATIONS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.