Published 1984 | Version v1
Book Metadata-only

Scanning electron microscopy and X-ray microanalysis. V. 1

Creators

  • 1. Lehigh Univ., Bethlehem, PA (USA)
  • 2. National Bureau of Standards, Washington, DC (USA)
  • 3. Cambridge Univ. (UK)
  • 4. Bell Labs., Murray Hill, NJ (USA)
  • 5. National Institutes of Health, Bethesda, MD (USA)
  • 6. General Electric Co., Schenectady, NY (USA). Research and Development Center

Description

Standard methods of scanning electron microscopy (SEM) and some aspects of roentgen microanalysis (RMA) are described. Characteristics of electron optic deivices are considered as well as interaction between electrons and solids, the theory of image formation in a scanning microscope, resolution and information capabilities of conditions for secondary and reflected electrons, X-ray spectroscopy with energy and wave length dispersion qualitative RMA

Additional details

Additional titles

Original title (Russian)
Растровая электронная микроскопия и рентгеновский микроанализ. Том 1

Publishing Information

Publisher
Mir.
Imprint Place
Moscow (USSR)
Imprint Pagination
303 p.

INIS

Country of Publication
USSR
Country of Input or Organization
USSR
INIS RN
16066831
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
DATA PROCESSING; ELECTRON MICROSCOPES; MICROANALYSIS; QUALITATIVE CHEMICAL ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS; RESOLUTION; SCANNING ELECTRON MICROSCOPY; SCATTERING; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY
Descriptors DEC
CHEMICAL ANALYSIS; ELECTRON MICROSCOPY; MEASURING INSTRUMENTS; MICROSCOPES; MICROSCOPY; SPECTROMETERS; SPECTROSCOPY

Optional Information

Notes
Translation from English.