Published October 15, 1985 | Version v1
Patent Metadata-only

Two dimensional radiation detecting apparatus

Creators

Description

A two-dimensional X-ray detecting apparatus is comprised of an amorphous silicon layer for trapping electrons in a pattern corresponding to an intensity distribution when it is receiving X-rays, and a scanning device for scanning the surface of the amorphous silicon layer with a laser beam to take out electrons trapped in the silicon layer

Availability note (English)

U.S. Commissioner of Patents, Washington, D.C. 20231, USA, $.50.

Additional details

Publishing Information

Imprint Pagination
v p.
IPC:
Int. Cl. G01T 1/24; H01L 31/02.
IPC
Int. Cl. G01T 1/24; H01L 31/02.
Patent number
US patent document 4,547,670/A/

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
17051905
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
AMORPHOUS STATE; COMPUTER CALCULATIONS; DATA PROCESSING; ELECTRON SCANNING; LASER RADIATION; LASERS; ON-LINE CONTROL SYSTEMS; SCINTILLATION COUNTERS; SCINTILLATION COUNTING; SILICON; SPECIFICATIONS; TWO-DIMENSIONAL CALCULATIONS; X-RAY DETECTION
Descriptors DEC
AMPLIFIERS; CONTROL SYSTEMS; COUNTING TECHNIQUES; DETECTION; ELECTROMAGNETIC RADIATION; ELEMENTS; EQUIPMENT; MEASURING INSTRUMENTS; ON-LINE SYSTEMS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SEMIMETALS

Optional Information

Notes
PAT-APPL-486514.