Window thickness measurements on surface barrier detectors with different surface treatments

Window thickness measurements using 340 keV protons from a Van de Graaff accelerator are reported for specially prepared detectors. Controlled surface conditions are employed during detector manufacture resulting in known surface conditions. The window effect is shown to be independent of resistivity, it being characterised by the electric field in the depletion region and the properties of the detector surface. Comparison is made with previous window studies. (orig.)