Fourier descriptor classification of differential eddy current probe impedance plane trajectories

This chapter describes the use of a parametric model for representing the two-dimensional eddy current impedance plane trajectory. The main advantage of this approach is the ability to reconstruct the trajectory from the model coefficients. Fourier descriptors are used to facilitate defect classification. The Fourier descriptors are obtained by expanding the complex contour function in a Fourier series. Functions of Fourier coefficients which are invariant under transformation of the trajectory are derived and incorporated into a feature vector. Defect classification is obtained by using the K-Means algorithm to cluster the feature vectors. It is demonstrated that the Fourier descriptor approach represents a powerful tool which have several advantages over nonparametric approaches including its insensitivity to drift in the eddy current instrument as well as variations in the probe speed