Published March 1, 1993
| Version v1
Journal article
First beam test results from a monolithic silicon pixel detector
- 1. Center for Integrated Systems, Stanford Univ., CA (United States)
- 2. Univ. Hawaii, Dept. of Physics, High Energy Physics Group, Honolulu, HI (United States)
Description
We have tested a telescope of four monolithic pixel detectors in a 300-600 GeV muon beam at Fermilab. The detectors were 300 μm thick and had 30x10 pixels of 34 by 125 μm2. The signal to single channel noise was 55 to 1 in the beam test. The position resolution in the 34 μm direction had a σ=2.2 μm. In an efficiency test the detectors did not miss any of 2665 minimum ionizing particle hits. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A
- Journal Volume
- 326
- Journal Issue
- 1/2
- Journal Page Range
- p. 144-149.
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- New developments on radiation detectors.
- Acronym
- 6. European symposium on semiconductor detectors
- Dates
- 24-26 Feb 1992.
- Place
- Milan (Italy).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 24036210
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- EFFICIENCY; ERRORS; GEV RANGE 100-1000; INTEGRATED CIRCUITS; MUON DETECTION; PARTICLE TRACKS; POSITION SENSITIVE DETECTORS; RELATIVISTIC RANGE; SI SEMICONDUCTOR DETECTORS; SIGNAL-TO-NOISE RATIO; SPATIAL RESOLUTION
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DETECTION; ELECTRONIC CIRCUITS; ENERGY RANGE; GEV RANGE; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS
Optional Information
- Contract/Grant/Project number
- Contract DE-AC03-83ER40103