Published February 28, 2005 | Version v1
Journal article Metadata-only

Development of imaging energy analyzer using multipole Wien filter

Creators

  • 1. Catalysis Research Center, Hokkaido University, 21-10 Kita, Kita-ku, Sapporo 001-0021 (Japan)
  • 2. JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558 (Japan)
  • 3. Core Research for Evolutional Science and Technology, Japan Science and Technology Corporation (Japan)
  • 4. Photon Factory, Institute of Materials Structure Science, Tsukuba 305-0801 (Japan)

Description

We discussed a new design of a Wien filter energy analyzer for an energy-filtered X-ray photoemission electron microscopy system. We have demonstrated that the second-order aberration and the third-order aperture aberration can be corrected by the multipole Wien filter by adjusting multipole components of electric and magnetic fields up to octupole components. The three-dimensional charge simulation method indicated that 12 electrodes and magnetic poles can effectively reproduce these ideal electric and magnetic fields

Additional details

Identifiers

DOI
10.1016/j.apsusc.2004.09.086;
PII
S0169-4332(04)01379-0;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
241
Journal Issue
1-2
Journal Page Range
p. 131-134
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
9. international symposium on advanced physical fields
Acronym
APF-9
Dates
1-4 Mar 2004
Place
Tsukuba (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38060533
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON MICROSCOPY; FILTERS; MAGNETIC FIELDS; PHOTOEMISSION; SIMULATION; X RADIATION
Descriptors DEC
ELECTROMAGNETIC RADIATION; EMISSION; IONIZING RADIATIONS; MICROSCOPY; RADIATIONS; SECONDARY EMISSION

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.