Published 2021 | Version v1
Journal article Metadata-only

Particle size and band gap calculation of pure Y2SiO5 crystal synthesized by solid-state reaction method

Creators

  • 1. Mahatam Gandhi University, Kottayam, Kerla (India)
  • 2. Bhilai Institute of Technology (Seth Balkrishan Memorial), Near Bhilai House, Durg, C.G. (India)

Description

Pure Yttrium silicate (Y2SiO5) crystal was synthesized by solid-state reaction method. The structural behavior of the sample was determined by X-ray diffraction analysis. The particle size of the sample was found around 35 nm. The particle size was further confirmed by transmission electron microscopy (TEM) analysis. The TEM images are well matched with the XRD analysis. The band gap of the Y2SiO5 was determined by Tauc's plot. The band gap of the sample was obtained 5.44eV. (author)

Additional details

Identifiers

URL
https://link.springer.com/article/10.1007/s13538-021-00859-x;
DOI
10.1007/s13538-021-00859-x;

Publishing Information

Journal Title
Brazilian Journal of Physics (Online)
Journal Volume
51
Journal Issue
3
Journal Page Range
p. 599-604
ISSN
1678-4448

INIS

Country of Publication
Brazil
Country of Input or Organization
Brazil
INIS RN
53034814
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CALCULATION METHODS; CRYSTAL STRUCTURE; PARTICLE SIZE; SYNTHESIS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; YTTRIUM SILICATES
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; OXYGEN COMPOUNDS; SCATTERING; SILICATES; SILICON COMPOUNDS; SIZE; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS