Published April 15, 2009 | Version v1
Journal article

Development and application of glancing incident X-ray fluorescence spectrometry using parallel polycapillary X-ray lens

  • 1. Institute of Low Energy Nuclear Physics, Beijing Radiation Center, Beijing Normal University, Beijing 100875 (China)
  • 2. Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100875 (China)

Description

A new glancing incident X-ray fluorescence (GIXRF) spectrometer using parallel polycapillary X-ray lens has been developed. Integrated with a Zr filter and slits, a highly collimated and monochromatic X-ray beam has been achieved. This method eliminated the monochromator used in the conventional GIXRF method. Moreover the parallel X-ray lens increased the acceptance solid angle and hence increases intensities of the excitation spectrum. In this paper, this method has been applied in analysis of single crystal and film sample.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2008.09.079

Additional details

Identifiers

DOI
10.1016/j.apsusc.2008.09.079;
PII
S0169-4332(08)02071-0;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
255
Journal Issue
13-14
Journal Page Range
p. 6439-6442
ISSN
0169-4332
CODEN
ASUSEE

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.