Fluorescence detection and imaging of amino-functionalized organic monolayer
- 1. National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 (Japan)
- 2. National Institute of Advanced Industrial Science and Technology (AIST), 2266-98 Anagahora, Shimo-shidami, Moriyama, Nagoya 463-8560 (Japan)
Description
Amino-terminated organic monolayer formed on silicon covered with native oxide (SiO2/Si) was directly visualized under observation with fluorescent microscopy. This successful fluorescence visualization was achieved by a combination of fluorescamine method and photopatterning of the amino-terminated surface. As a typical example, an amino-terminated self-assembled monolayer (SAM) was formed on SiO2/Si substrate in a vapor of 12.5 vol.% solution of N-(6-aminohexyl)-3-aminopropyltrimethoxysilane [H2N(CH2)6NH(CH2)3Si(OCH3)3, AHAPS] diluted with absolute toluene. A micropattern of AHAPS-SAM was photolithographycally prepared using 172 nm vacuum ultraviolet (VUV) light under a reduced pressure of 10 Pa for 30 min through a photomask. The resultant micropattern composed of AHAPS- and SiOH-covered regions was provided to fluorescamine method. Due to a nonluminescence of fluorescamine itself under UV/visible irradiation, a fluorescent emission could not be observed on SiOH regions of the micropattern. In contrast, fluorescamine reacted with the outermost amino group of the AHAPS-SAM to give a fluorescent emission. A comprehensible fluorescence method for verifying formation of an amino-terminated organic monolayer has been developed
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2007.04.096Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2007.04.096;
- PII
- S0040-6090(07)00706-7;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 516
- Journal Issue
- 9
- Journal Page Range
- p. 2541-2546
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 7. international conference on nano-molecular electronics
- Acronym
- ICNME 2006
- Dates
- 13-15 Dec 2006
- Place
- Kobe (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39073734
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- FAR ULTRAVIOLET RADIATION; FLUORESCENCE; IRRADIATION; MICROSCOPY; SILICON; SILICON OXIDES; TOLUENE
- Descriptors DEC
- ALKYLATED AROMATICS; AROMATICS; CHALCOGENIDES; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; HYDROCARBONS; LUMINESCENCE; ORGANIC COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; RADIATIONS; SEMIMETALS; SILICON COMPOUNDS; ULTRAVIOLET RADIATION
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.