Spin susceptibility of one-dimensional extended Hubbard model at quarter filling
Creators
- 1. Department of Physics, University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)
Description
The ground-state property of one-dimensional extended Hubbard model is investigated at quarter filling. By using spin-charge factorized wave function in the U->∼ limit, the effective exchange coupling Jeff and spin susceptibility χ are calculated as a function of nearest-neighbor Coulomb interaction V. It is found that Jeff is suppressed by the effect of V through charge fluctuation. The results indicate these quantities have no singularities at the transition point because of the Berezinskii-Kosterlitz-Thouless-type transition of charge ordering. We also confirm the results by exact diagonalization method in the realistic parameter range. The relevance to the experiments on quasi one-dimensional organic conductor (DI-DCNQI)2Ag is discussed
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2006.01.115;
- PII
- S0921-4526(06)00152-9;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 378-380
- Journal Page Range
- p. 317-318
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- International conference on strongly correlated electron systems
- Acronym
- SCES 2005
- Dates
- 26-30 Jul 2005
- Place
- Vienna (Austria)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38066404
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COULOMB FIELD; COUPLING; ELECTRIC CONDUCTORS; FLUCTUATIONS; GROUND STATES; HUBBARD MODEL; ONE-DIMENSIONAL CALCULATIONS; ORGANIC COMPOUNDS; SILVER COMPOUNDS; SINGULARITY; SPIN; WAVE FUNCTIONS
- Descriptors DEC
- ANGULAR MOMENTUM; CRYSTAL MODELS; ELECTRIC FIELDS; ENERGY LEVELS; FUNCTIONS; MATHEMATICAL MODELS; PARTICLE PROPERTIES; TRANSITION ELEMENT COMPOUNDS; VARIATIONS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.