Published May 1, 2006 | Version v1
Journal article

Spin susceptibility of one-dimensional extended Hubbard model at quarter filling

  • 1. Department of Physics, University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)

Description

The ground-state property of one-dimensional extended Hubbard model is investigated at quarter filling. By using spin-charge factorized wave function in the U->∼ limit, the effective exchange coupling Jeff and spin susceptibility χ are calculated as a function of nearest-neighbor Coulomb interaction V. It is found that Jeff is suppressed by the effect of V through charge fluctuation. The results indicate these quantities have no singularities at the transition point because of the Berezinskii-Kosterlitz-Thouless-type transition of charge ordering. We also confirm the results by exact diagonalization method in the realistic parameter range. The relevance to the experiments on quasi one-dimensional organic conductor (DI-DCNQI)2Ag is discussed

Additional details

Identifiers

DOI
10.1016/j.physb.2006.01.115;
PII
S0921-4526(06)00152-9;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
378-380
Journal Page Range
p. 317-318
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
International conference on strongly correlated electron systems
Acronym
SCES 2005
Dates
26-30 Jul 2005
Place
Vienna (Austria)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38066404
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COULOMB FIELD; COUPLING; ELECTRIC CONDUCTORS; FLUCTUATIONS; GROUND STATES; HUBBARD MODEL; ONE-DIMENSIONAL CALCULATIONS; ORGANIC COMPOUNDS; SILVER COMPOUNDS; SINGULARITY; SPIN; WAVE FUNCTIONS
Descriptors DEC
ANGULAR MOMENTUM; CRYSTAL MODELS; ELECTRIC FIELDS; ENERGY LEVELS; FUNCTIONS; MATHEMATICAL MODELS; PARTICLE PROPERTIES; TRANSITION ELEMENT COMPOUNDS; VARIATIONS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.