Preparation and photoelectric properties of p-CaFe2O4/n-WO3 composites
Creators
- 1. Key Laboratory of Photovoltaic Materials of Henan Province and School of Physics and Electronics, Henan University, Kaifeng 475004 (China)
Description
Highlights: ► Surface photovoltage spectroscopy investigation on p-CaFe2O4/n-WO3 composites. ► The photovoltaic response is enhanced in p-CaFe2O4/n-WO3 composites. ► The multielectron process and high rate of carrier migration in WO3. - Abstract: Composites of p-CaFe2O4/n-WO3 are prepared via a sol–gel technique. Their structures and optical properties are characterized with X-ray diffraction, scanning electron microscopy and UV–vis absorption spectroscopy. The photoelectric characteristics are investigated by surface photovoltage spectroscopy combined with electric field induced surface photovoltage spectroscopy. The results indicate that CaFe2O4 can well form a p–n type composite with WO3, and the intensity and spectral region of surface photovoltaic response for the composites are strongly dependent on the molar ratio of two components. The enhancement in photoelectric properties and the effective separation of photogenerated carriers could be attributed to the energy level matching between the two components, multielectron process and the high migration rate in WO3.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2012.07.134Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2012.07.134;
- PII
- S0925-8388(12)01351-5;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 544
- Journal Page Range
- p. 1-5
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44108739
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ADMINISTRATIVE PROCEDURES; COMPOSITE MATERIALS; ELECTRIC FIELDS; ENERGY LEVELS; MIGRATION; OPTICAL PROPERTIES; PHOTOVOLTAIC EFFECT; SCANNING ELECTRON MICROSCOPY; SURFACES; TUNGSTATES; TUNGSTEN OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MATERIALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRIC EFFECT; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; SCATTERING; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.