Published April 1, 2018 | Version v1
Journal article

Channeling experiments at planar diamond and silicon single crystals with electrons from the Mainz Microtron MAMI

  • 1. Institute for Nuclear Physics of Johannes Gutenberg-University, Johann-Joachim-Becher-Weg 45, D-55128 Mainz (Germany)
  • 2. X-ray Optics Group, ESRF, CS 40220, F-38043 Grenoble Cedex 9 (France)

Description

Line structures were observed for (110) planar channeling of electrons in a diamond single crystal even at a beam energy of 180 MeV . This observation motivated us to initiate dechanneling length measurements as function of the beam energy since the occupation of quantum states in the channeling potential is expected to enhance the dechanneling length. High energy loss signals, generated as a result of emission of a bremsstrahlung photon with about half the beam energy at channeling of 450 and 855 MeV electrons, were measured as function of the crystal thickness. The analysis required additional assumptions which were extracted from the numerical solution of the Fokker-Planck equation. Preliminary results for diamond are presented. In addition, we reanalyzed dechanneling length measurements at silicon single crystals performed previously at the Mainz Microtron MAMI at beam energies between 195 and 855 MeV from which we conclude that the quality of our experimental data set is not sufficient to derive definite conclusions on the dechanneling length. Our experimental results are below the predictions of the Fokker-Planck equation and somewhat above the results of simulation calculations of A. V. Korol and A. V. Solov'yov et al. on the basis of the MBN Explorer simulation package. We somehow conservatively conclude that the prediction of the asymptotic dechanneling length on the basis of the Fokker-Planck equation represents an upper limit.

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/13/04/C04022

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
13
Journal Issue
04
Journal Page Range
p. C04022
ISSN
1748-0221