Investigation of droplet formation in pulsed Nd:YAG laser deposition of metals and silicon
Creators
- 1. Multimedia University, Faculty of Engineering, Cyberjaya, Selangor (Malaysia)
- 2. Universiti Tunku Abdul Rahman, Faculty of Engineering and Science, Kuala Lumpur (Malaysia)
- 3. Norwegian University of Science and Technology, Institute of Physics, Trondheim (Norway)
Description
In the process of pulsed laser deposition of nickel (Ni) and ruthenium (Ru) thin films, the occurrence of phase explosion in ablation was found to affect the deposition rate and enhance the optical emissions from the plasma plume. Faster thin-film growth rates coincide with the onset of phase explosion as a result of superheating and/or sub-surface boiling which also increased the particulates found on the thin-film surface. These particulates were predominantly droplets which may not be round but flattened and also debris for the case of silicon (Si) ablation. The droplets from Ni and Ru thin films were compared in terms of size distribution and number density for different laser fluences. The origins of these particulates were correlated to the bubble and ripple formations on the targets while the transfer to the thin film surface was attributed to the laser-induced ejection from the targets. (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1007/s00339-010-5914-7Additional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing
- Journal Volume
- 101
- Journal Issue
- 4
- Series
- Special issue: Materials growth by pulsed laser deposition
- Journal Page Range
- p. 627-632
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 42023275
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABLATION; BUBBLES; DEPOSITION; DROPLETS; EMISSION SPECTRA; LASER BEAM MACHINING; LASER RADIATION; NICKEL; PARTICLE SIZE; PARTICULATES; PULSED IRRADIATION; SCANNING ELECTRON MICROSCOPY; SHAPE; SILICON; SUPERHEATING; SURFACES; THICKNESS; THIN FILMS; ULTRAVIOLET SPECTRA; VISIBLE SPECTRA
- Descriptors DEC
- DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; HEATING; IRRADIATION; MACHINING; METALS; MICROSCOPY; PARTICLES; RADIATIONS; SEMIMETALS; SIZE; SPECTRA; TRANSITION ELEMENTS