Published 1983
| Version v1
Miscellaneous
Design of a processor-controlled data acquisition system for low temperature diffractometry
Description
Hardware and software for sample temperature control and data uptake in a low temperature X-ray diffractometer are described. (G.Q.)
Availability note (English)
Available from Technical University Vienna, Karlsplatz 13, A-1040 Vienna.Additional details
Additional titles
- Original title (German)
- Entwicklung einer prozessorgesteuerten Messwerterfassung fuer Tieftemperaturdiffraktometrie
- Augmented title (English)
- X-ray diffractometer
Publishing Information
- Imprint Pagination
- 213 p.
INIS
- Country of Publication
- Austria
- Country of Input or Organization
- Austria
- INIS RN
- 15062093
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Thesis, Non-conventional Literature
- Descriptors DEI
- CONTROL SYSTEMS; DATA ACQUISITION; TEMPERATURE CONTROL; X-RAY SPECTROMETERS
- Descriptors DEC
- CONTROL; MEASURING INSTRUMENTS; SPECTROMETERS
Optional Information
- Notes
- Ref. no. 174222 II.