Published 2019 | Version v1
Book

Effect of repeated high dose exposure on the background count and sensitivity of TLD cards

  • 1. Radiological Physics and Advisory Division, Bhabha Atomic Research Centre, Trombay, Mumbai 400085 (India)

Description

The present work was carried out in order to see the variation in the background count after repeated exposure to high doses. In view of the fact that the cards were to be subjected to high doses, cards which were not acceptable for service were used in the study. Therefore, the observed standard deviations are higher than that of service cards. However, it is anticipated that the results will give an idea of the change in background counts and sensitivity of the cards. TLD cards loaded in cassette were exposed free-in-air geometry as per the routine personnel monitoring procedure

Part of:
Proceedings of the twenty second national symposium on radiation physics: abstract book

Additional details

Publishing Information

Publisher
Jawaharlal Nehru University
Imprint Place
New Delhi (India)
Imprint Title
Proceedings of the twenty second national symposium on radiation physics: abstract book
Imprint Pagination
216 p.
Journal Page Range
p. 141

Conference

Title
22. national symposium on radiation physics
Acronym
NSRP-22
Dates
8-10 Nov 2019
Place
New Delhi (India)

INIS

Country of Publication
India
Country of Input or Organization
India
INIS RN
54050462
Subject category
S61: RADIATION PROTECTION AND DOSIMETRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
OCCUPATIONAL EXPOSURE; OCCUPATIONAL SAFETY; PERSONNEL MONITORING; RADIATION DOSES; THERMOLUMINESCENT DOSEMETERS
Descriptors DEC
DOSEMETERS; DOSES; LUMINESCENT DOSEMETERS; MEASURING INSTRUMENTS; MONITORING; RADIATION MONITORING; SAFETY

Optional Information