Published 2019
| Version v1
Book
Effect of repeated high dose exposure on the background count and sensitivity of TLD cards
- 1. Radiological Physics and Advisory Division, Bhabha Atomic Research Centre, Trombay, Mumbai 400085 (India)
Description
The present work was carried out in order to see the variation in the background count after repeated exposure to high doses. In view of the fact that the cards were to be subjected to high doses, cards which were not acceptable for service were used in the study. Therefore, the observed standard deviations are higher than that of service cards. However, it is anticipated that the results will give an idea of the change in background counts and sensitivity of the cards. TLD cards loaded in cassette were exposed free-in-air geometry as per the routine personnel monitoring procedure
Additional details
Publishing Information
- Publisher
- Jawaharlal Nehru University
- Imprint Place
- New Delhi (India)
- Imprint Title
- Proceedings of the twenty second national symposium on radiation physics: abstract book
- Imprint Pagination
- 216 p.
- Journal Page Range
- p. 141
Conference
- Title
- 22. national symposium on radiation physics
- Acronym
- NSRP-22
- Dates
- 8-10 Nov 2019
- Place
- New Delhi (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 54050462
- Subject category
- S61: RADIATION PROTECTION AND DOSIMETRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- OCCUPATIONAL EXPOSURE; OCCUPATIONAL SAFETY; PERSONNEL MONITORING; RADIATION DOSES; THERMOLUMINESCENT DOSEMETERS
- Descriptors DEC
- DOSEMETERS; DOSES; LUMINESCENT DOSEMETERS; MEASURING INSTRUMENTS; MONITORING; RADIATION MONITORING; SAFETY