Scaling properties of YBa2Cu3Ox films

An alternative simple method is proposed for analysing the scaling properties of the high-Tc superconductor cuprates. The temperature is rescaled with a parameter TR determined from the precise analysis of RH(1/T), where RH is the Hall coefficient, in the high-temperature range. To illustrate this new method, the resistivity and Hall effect data obtained on underdoped YBa2Cu3Ox epitaxial thin films are analysed. It is shown that the temperature-dependent resistivity ρ(T), Hall coefficient RH(T) and the cotangent of the Hall angle cot θH(T) of underdoped YBa2Cu3Ox can be scaled into universal curves using this parameter TR to make a linear transformation of temperature and ρ(T), RH(T) or cotθH(T)