Published 1985
| Version v1
Journal article
Study of a setup for PIXE analysis
- 1. Warsaw Univ. (Poland). Inst. Fizyki Doswiadczalnej
Description
An experimental setup for PIXE analysis of trace elements in different samples is presented. A detailed analysis of its main elements is given with the emphasis on their function in the setup. The results on beam profiling, calibration of the charge collecting system, efficiency and sensitivity of the setup are presented and discussed. Basing on statistical considerations a new criterion for the PIXE sensitivity in the region of vanishing background is proposed. 13 refs., 6 figs. (author)
Additional details
Publishing Information
- Journal Title
- Nukleonika
- Journal Volume
- 30
- Journal Issue
- 5-6
- Series
- Nukleonika.
- Journal Page Range
- 157-175
- ISSN
- 0029-5922
- CODEN
- NUKLA
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 20030486
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- BEAM PROFILES; BEAM TRANSPORT; CALIBRATION; CHARGE COLLECTION; DATA ACQUISITION SYSTEMS; EFFICIENCY; FARADAY CUPS; LI-DRIFTED SI DETECTORS; MEASURING INSTRUMENTS; PERFORMANCE TESTING; PIXE ANALYSIS; SENSITIVITY; TRACE AMOUNTS
- Descriptors DEC
- BEAM MONITORS; CHEMICAL ANALYSIS; LI-DRIFTED DETECTORS; MONITORS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; TESTING; X-RAY EMISSION ANALYSIS