Development of a new linearly variable edge filter (LVEF)-based compact slit-less mini-spectrometer
- 1. Division of Physical Metrology, Korea Research Institute of Standards and Science (KRISS), Daejeon, 34113, Rep. Korea. (Korea, Republic of)
Description
This paper presents the development of a compact charge-coupled detector (CCD) spectrometer. We describe the design, concept and characterization of VNIR linear variable edge filter (LVEF)- based mini-spectrometer. The new instrument has been realized for operation in the 300 nm to 850 nm wavelength range. The instrument consists of a linear variable edge filter in front of CCD array. Low-size, light-weight and low-cost could be achieved using the linearly variable filters with no need to use any moving parts for wavelength selection as in the case of commercial spectrometers available in the market. This overview discusses the main components characteristics, the main concept with the main advantages and limitations reported. Experimental characteristics of the LVEFs are described. The mathematical approach to get the position-dependent slit function of the presented prototype spectrometer and its numerical de-convolution solution for a spectrum reconstruction is described. The performance of our prototype instrument is demonstrated by measuring the spectrum of a reference light source. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/972/1/012026Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 972
- Journal Issue
- 1
- Journal Page Range
- [8 p.]
- ISSN
- 1742-6596
Conference
- Title
- 13. International Conference on New Developments and Applications in Optical Radiometry
- Dates
- 13-16 Jun 2017
- Place
- Tokyo (Japan)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52080095
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE-COUPLED DEVICES; FILTERS; PERFORMANCE; SPECTRA; SPECTROMETERS; WAVELENGTHS
- Descriptors DEC
- MEASURING INSTRUMENTS; SEMICONDUCTOR DEVICES