Published July 7, 2009 | Version v1
Journal article

Laser-Aided Diagnostics of Atoms and Particulates in Magnetron Sputtering Plasmas

  • 1. Microelectronics and Nanotechnology-Shamsuddin Research Centre (MiNT-SRC), Faculty of Electrical and Electronic Engineering, University Tun Hussein Onn Malaysia, 86400 Batu Pahat, Johor (Malaysia)
  • 2. Department of Electrical Engineering and Computer Science, Nagoya University, 464-8603 Chikusa-ku Nagoya (Japan)
  • 3. Plasma Nanotechnology Research Center, Nagoya University, 464-8603 Chikusa-ku Nagoya (Japan)

Description

Laser-aided diagnostic technique is introduced as an advanced and valuable technique to evaluate the properties of plasma. This technique is an expensive and sophisticated technique which requires researchers to have a basic knowledge in optical spectroscopy. In the present paper, we will generally introduce the experimental work using laser-induced fluorescence (LIF) and laser light scattering (LLS) techniques. The LIF was used to evaluate the spatial distribution of Cu atoms in magnetron sputtering plasma. The change in the spatial distribution was studied as a function of discharge power. On the other hand, the LLS was used to evaluate the generation of Cu particulates in high-pressure magnetron sputtering plasma. The temporal evolution of Cu particulates in the gas phase of sputtering plasma was visualized successfully.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1150
Journal Issue
1
Journal Page Range
p. 174-179
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
3. international meeting on frontiers in physics
Dates
12-16 Jan 2009
Place
Kuala Lumpur (Malaysia)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41075152
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMS; COPPER; ELECTRIC DISCHARGES; FLUORESCENCE; LASER RADIATION; LASERS; MAGNETRONS; PARTICULATES; PLASMA; PLASMA DIAGNOSTICS; PLASMA PRESSURE; SPATIAL DISTRIBUTION; SPUTTERING
Descriptors DEC
DISTRIBUTION; ELECTROMAGNETIC RADIATION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EMISSION; EQUIPMENT; LUMINESCENCE; METALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; PARTICLES; PHOTON EMISSION; RADIATIONS; TRANSITION ELEMENTS

Optional Information

Notes
(c) 2009 American Institute of Physics