Methodology optimization of the thallium bromide crystal preparation for application as a radiation detector

In this work, TlBr crystals have been purified and grown by the Repeated Bridgman method from commercial TlBr materials and characterized to be used as radiation detectors. To evaluate the purification efficiency, studies on the impurity concentration decrease were performed after each growth, analyzing the trace impurities by inductively coupled plasma mass spectroscopy (ICP-MS). A significant decrease of the concentration of impurities in function of the purification number was observed. The grown crystals presented good crystalline quality according to the results of the x-ray diffraction analysis. To evaluate the crystals to be used as a semiconductor detector, measurements of the resistivity and the pulse height under 241Am gamma rays were carried out. The radiation response was strongly dependent on the crystal purity. The Repeated Bridgman technique showed to be effective to reduce the concentration of impurities and to improve the TlBr crystal quality to be used as a radiation semiconductor detector. A compartmental model was proposed to fit the concentration/segregation of impurities in function of the Bridgman growth step number. This compartmental model is defined by differential equations and can be used to calculate the rate of migration of impurities. It proved to be a useful tool in predicting the number of Bridgman growth repetitions necessary to achieve the desired impurity concentration. The difference of the impurity migration rates between the crystals grown, using salts from different origins, was significant. Therefore, the choice of the starting salt should be performed experimentally, regardless of the statement nominal purity. (author)