Published 1988
| Version v1
Book
Surface chemistry of dry etching processes
Creators
- 1. North Carolina Univ., Chapel Hill (USA). Dept. of Chemistry
Description
Much of the fundamental information that has been obtained regarding dry etching processes has come via simulations of the etching environment using beams of ions and reactive neutral species in high or ultrahigh vacuum where the tools of surface science can be applied. This review concentrates mostly on results obtained from these various simulations of the dry process environment. The effects of energetic ion impact on surfaces, both in the absence and presence of reactive adsorbates, and the synergistic effects that result from the simultaneous exposure of the surface to reactive neutrals and energetic ions are examined. 170 refs.; 23 figs.; 1 table
Additional details
Additional titles
- Subtitle (English)
- Chapter 10
Publishing Information
- Publisher
- Elsevier.
- Imprint Place
- Amsterdam (Netherlands)
- ISBN
- 0-444-42782-1
- Imprint Title
- Surface properties of electronic materials
- Imprint Pagination
- 487 p.
- Journal Volume
- 5
- Series
- The Chemical Physics of Solid Surfaces and Heterogeneous Catalysis.
- Journal Page Range
- p. 427-464.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 19074220
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ARGON IONS; CARBON FLUORIDES; CARBON IONS; CHLORINE IONS; ETCHING; EV RANGE 100-1000; FLUORINE IONS; INCIDENCE ANGLE; ION BEAMS; KINETIC ENERGY; MOLECULAR IONS; NEON IONS; REVIEWS; SILICON; SPUTTERING; SURFACES
- Descriptors DEC
- ATOMIC IONS; BEAMS; CARBON COMPOUNDS; CHARGED PARTICLES; DOCUMENT TYPES; ELEMENTS; ENERGY; ENERGY RANGE; EV RANGE; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; IONS; SEMIMETALS
Optional Information
- Notes
- Imprint:Includes index.