Electronic structure and valence state of CeAl2 from X-ray absorption and emission spectroscopy
- 1. Department of Physics, Tamkang University, Tamsui 251, Taiwan, (China)
- 2. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)
- 3. Department of Physics, Uppsala University, Box 530, SE-75121 Uppsala (Sweden)
- 4. Institute of Physics, Academia Sinica, Taipei, Taiwan, (China)
Description
Soft X-ray absorption spectroscopy (XAS) and resonant inelastic X-ray scattering (RIXS) have been performed on CeAl2 bulk and nanoparticles of 8 nm to study the quantum size effect of this heavy-fermion compound. XAS and RIXS spectra recorded at selected photon energies, reflect the local unoccupied and occupied electronic states. These spectral shape changes are attributed to surface effects originated from the reducing particle size, which gives rise to different hybridization between the 4f orbitals and conduction band. The Ce in nanoparticles exhibits mixed valencies with a small portion of tetravalent Ce in contrast to the mostly trivalent Ce observed in the bulk CeAl2. RIXS spectra show a strong dependence on the excitation energies. The experimental results suggest the different f-electron configurations for bulk and nanoparticle CeAl2
Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2005.01.177;
- PII
- S0368-2048(05)00208-2;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 144-147
- Journal Page Range
- p. 581-584
- ISSN
- 0368-2048
- CODEN
- JESRAW
Conference
- Title
- 14. international conference on vacuum ultraviolet radiation physics
- Acronym
- VUV 14
- Dates
- 19-23 Jul 2004
- Place
- Cairns (Australia)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37039822
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; ABSORPTION SPECTRA; ABSORPTION SPECTROSCOPY; ALUMINIUM; CERIUM; ELECTRONIC STRUCTURE; ELECTRONS; EMISSION SPECTRA; EMISSION SPECTROSCOPY; EXCITATION; INTERMETALLIC COMPOUNDS; NANOSTRUCTURES; PARTICLE SIZE; PHOTONS; SOFT X RADIATION; SURFACES; VALENCE; X-RAY DIFFRACTION; X-RAY SPECTRA; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALLOYS; BOSONS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; ENERGY-LEVEL TRANSITIONS; FERMIONS; IONIZING RADIATIONS; LEPTONS; MASSLESS PARTICLES; METALS; RADIATIONS; RARE EARTHS; SCATTERING; SIZE; SORPTION; SPECTRA; SPECTROSCOPY; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.