Published September 3, 2007 | Version v1
Journal article Metadata-only

Investigation of the structural transformation behavior of Ge2Sb2Te5 thin films using high resolution electron microscopy

Creators

  • 1. Semiconductor Materials and Devices Laboratory, Korea Institute of Science and Technology, Seoul 136-791 (Korea, Republic of)
  • 2. Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 305-701 (Korea, Republic of)

Description

Structural transformation of the Ge2Sb2Te5 was investigated by a high resolution transmission electron microscopy (HRTEM). It was found that Ge atoms undergo umbrella-flip motion from a tetrahedral site into an octahedral site in transforming from the amorphous to the metastable phase of Ge2Sb2Te5. The presence of a twin boundary between fcc and hexagonal structured Ge2Sb2Te5 was also confirmed through the HRTEM observations. These results support the umbrella-flip model proposed by Kolobov et al. [Nat. Mater. 3, 703 (2004)] and the epitaxial growth model proposed by Park et al. [Appl. Surf. Sci. 256, 8102 (2006)]

Additional details

Identifiers

DOI
10.1063/1.2783478;

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
91
Journal Issue
10
Journal Page Range
p. 101909-101909.3
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39038348
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
AMORPHOUS STATE; ANTIMONY ALLOYS; EPITAXY; FCC LATTICES; GERMANIUM ALLOYS; PHASE TRANSFORMATIONS; TELLURIUM ALLOYS; TERNARY ALLOY SYSTEMS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ALLOY SYSTEMS; ALLOYS; CRYSTAL GROWTH METHODS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; ELECTRON MICROSCOPY; FILMS; MICROSCOPY

Optional Information

Notes
(c) 2007 American Institute of Physics