Experimental check of the use of unconventional reference materials for EDS analysis in a TEM by extrapolation method based on pure elements
- 1. ENEA, Materials Technology Unit, Research Centre of Brindisi, S.S. 7 Appia – km 706.00, IT-72100 Brindisi (Italy)
- 2. Consiglio Nazionale delle Ricerche (CNR), Institute of Crystallography, Via G. Amendola 122/0, IT-70126 Bari (Italy)
- 3. ST Microelectronics, QA and Phys. Lab., Stradale Primosole 50, IT-95100 Catania (Italy)
Description
In this work, the use of unconventional reference materials to determine experimentally the Cliff-Lorimer factor for EDS quantitative analysis with a TEM is checked by means of an alternative experimental procedure. The k-factor is determined by the extrapolation method based on pure elements, by measuring the normalized X-ray intensities emitted by thin films of pure gold and pure silver of different thickness, accurately measured by X-ray reflectivity. The goal of this work is to confirm the value of the k-factor previously obtained by the use of unconventional reference materials consisting of a bi-layer of pure gold on pure silver. The current result is in accordance with the previous one when considering their error bars, however, their relative difference is about 13 %, probably due to some uncertainties in mass thickness measurements. The mass thickness measurement of the layers of pure elements needs to be performed by different methods in order to reduce its uncertainty.
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/32/1/012017Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 32
- Journal Issue
- 1
- Journal Page Range
- [11 p.]
- ISSN
- 1757-899X
Conference
- Title
- 12. European workshop on modern developments in microbeam analysis
- Acronym
- EMAS 2011
- Dates
- 15-19 May 2011
- Place
- Angers (France)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43100815
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- EXTRAPOLATION; GOLD; LAYERS; REFLECTIVITY; SILVER; THICKNESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RADIATION
- Descriptors DEC
- DIMENSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; IONIZING RADIATIONS; MATHEMATICAL SOLUTIONS; METALS; MICROSCOPY; NUMERICAL SOLUTION; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SURFACE PROPERTIES; TRANSITION ELEMENTS