Passivation of CdZnTe surfaces by oxidation in low energy atomic oxygen
Creators
- 1. Center for Photonic Materials and Devices, Department of Physics, Fisk University, Nashville, Tennessee 37208 (United States)
- 2. Department of Chemistry, University of Alabama in Huntsville, Huntsville, Alabama 35899 (United States)
- 3. Advanced Electronics Manufacturing Technologies Department, Sandia National Laboratories, Livermore, California 94550 (United States)
Description
A method of surface passivation of Cd1-xZnxTe (CZT) x-ray and gamma ray detectors has been established by using microwave-assisted atomic oxygen bombardment. Detector performance is significantly enhanced due to the reduction of surface leakage current. CZT samples were exposed to an atomic oxygen environment at the University of Alabama in Huntsville close-quote s Thermal Atomic Oxygen Facility. This system generates neutral atomic oxygen species with kinetic energies of 0.1 - 0.2 eV. The surface chemical composition and its morphology modification due to atomic oxygen exposure were studied by x-ray photoelectron spectroscopy and atomic force microscopy and the results were correlated with current-voltage measurements and with room temperature spectral responses to 133Ba and 241Am radiation. A reduction of leakage current by about a factor of 2 is reported, together with significant improvement in the gamma-ray line resolution. copyright 1999 American Vacuum Society
Additional details
Additional titles
- Augmented title (English)
- (Cd,Zn)Te
Publishing Information
- Journal Title
- Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films
- Journal Volume
- 17
- Journal Issue
- 1
- Journal Page Range
- p. 97-101
- ISSN
- 0734-2101
- CODEN
- JVTAD6
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30010816
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CADMIUM COMPOUNDS; CADMIUM TELLURIDES; CHEMICAL COMPOSITION; GAMMA DETECTION; LEAKAGE CURRENT; OXIDATION; OXYGEN; PASSIVATION; PHOTOELECTRON SPECTROSCOPY; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SURFACES; X-RAY DETECTION; ZINC COMPOUNDS; ZINC TELLURIDES
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL REACTIONS; CURRENTS; DETECTION; ELECTRIC CURRENTS; ELECTRON SPECTROSCOPY; ELEMENTS; MEASURING INSTRUMENTS; NONMETALS; RADIATION DETECTION; RADIATION DETECTORS; SPECTROSCOPY; TELLURIDES; TELLURIUM COMPOUNDS; ZINC COMPOUNDS