Preliminary results of microbeam at Tohoku University
Description
A microbeam system is under construction in the Dynamitron laboratory at Tohoku University for the purpose of applying X-rays produced by a microproton beam as monochromatic X-ray point source to biological and materials research etc. The system consists of a dedicated beam line with a doublet quadrupole and a slit-system of microslits, divergence-defining slits and baffle slits connected to the 4.5 MV Dynamitron accelerator's energy analyzing system, which was a newly installed second analyzing magnet. The demagnification factors are 8.0 and 27.5 for horizontal and vertical planes, respectively. Performance of the microbeam system was tested by beam scanning across the surface of a copper mesh sample (1000 lines/inch) and measuring the X-ray spectrum. A beam spot size of 2 x 2 μm2, which is larger than the design goal, is currently obtained. We are now adjusting the whole system to achieve a beam spot size of 1 x 1 μm2
Additional details
Identifiers
- PII
- S0168583X03010140;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 210
- Journal Issue
- 1
- Journal Page Range
- p. 59-64
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 8. international conference on nuclear microprobe technology and applications
- Dates
- 8-13 Sep 2002
- Place
- Takasaki (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34077579
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM ANALYZERS; BEAM SCANNERS; BIOLOGICAL MATERIALS; CWIP; DYNAMITRONS; ENERGY ANALYSIS; ION SOURCES; PROTON BEAMS; X-RAY SOURCES; X-RAY SPECTROSCOPY
- Descriptors DEC
- ACCELERATORS; BEAM MONITORS; BEAMS; CONSTRUCTION; ELECTROSTATIC ACCELERATORS; MATERIALS; MEASURING INSTRUMENTS; MONITORS; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION SOURCES; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.