Published September 2003 | Version v1
Journal article

Preliminary results of microbeam at Tohoku University

Description

A microbeam system is under construction in the Dynamitron laboratory at Tohoku University for the purpose of applying X-rays produced by a microproton beam as monochromatic X-ray point source to biological and materials research etc. The system consists of a dedicated beam line with a doublet quadrupole and a slit-system of microslits, divergence-defining slits and baffle slits connected to the 4.5 MV Dynamitron accelerator's energy analyzing system, which was a newly installed second analyzing magnet. The demagnification factors are 8.0 and 27.5 for horizontal and vertical planes, respectively. Performance of the microbeam system was tested by beam scanning across the surface of a copper mesh sample (1000 lines/inch) and measuring the X-ray spectrum. A beam spot size of 2 x 2 μm2, which is larger than the design goal, is currently obtained. We are now adjusting the whole system to achieve a beam spot size of 1 x 1 μm2

Additional details

Identifiers

PII
S0168583X03010140;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
210
Journal Issue
1
Journal Page Range
p. 59-64
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
8. international conference on nuclear microprobe technology and applications
Dates
8-13 Sep 2002
Place
Takasaki (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
34077579
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM ANALYZERS; BEAM SCANNERS; BIOLOGICAL MATERIALS; CWIP; DYNAMITRONS; ENERGY ANALYSIS; ION SOURCES; PROTON BEAMS; X-RAY SOURCES; X-RAY SPECTROSCOPY
Descriptors DEC
ACCELERATORS; BEAM MONITORS; BEAMS; CONSTRUCTION; ELECTROSTATIC ACCELERATORS; MATERIALS; MEASURING INSTRUMENTS; MONITORS; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION SOURCES; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.