Published 1991
| Version v1
Miscellaneous
Formation of silicides on Cu(100)/Si(100), Cu/Si(111), Cu/a-Si and Cu/a-Si:H interfaces analysed by x-ray diffraction
Creators
- 1. Universidade Federal, Rio de Janeiro, RJ (Brazil). Coordenacao dos Programas de Pos-graduacao de Engenharia
Description
Published in summary form only
Additional details
Additional titles
- Original title (Portuguese)
- Formacao de silicetos nas interfaces Cu(100)/Si(100), Cu/Si(111), Cu/a-Si e Cu/a-Si:H analisados com difracao de raios-x
Publishing Information
- Imprint Title
- Proceedings of the 14. National Meeting on Condensed Matter Physics. v.2
- Imprint Pagination
- 201 p.
- Journal Page Range
- p. 375.
- Report number
- INIS-BR--2933
Conference
- Title
- 14. National Meeting on Condensed Matter Physics.
- Dates
- 7-11 May 1991.
- Place
- Caxambu, MG (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 23081849
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- COPPER; DEPOSITION; HYDROGEN; INTERFACES; MONOCRYSTALS; ORIENTATION; SILICIDES; SILICON; SPUTTERING; TEMPERATURE RANGE 0400-1000 K; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELEMENTS; FILMS; METALS; NONMETALS; SCATTERING; SEMIMETALS; SILICON COMPOUNDS; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Notes
- Imprint:Anais do 14. Encontro Nacional de Fisica da Materia Condensada. v. 2.