Published November 1991 | Version v1
Journal article Metadata-only

Atomic emission analysis of high-purity XeF2

Creators

Description

The method of emission spectrochemical analysis of XeF2 on the content of nonvolatile metal fluoride impurities. The detection limit of metal impurities of Fe, Ni, Co, Cu, Mn, Mg, Al, Na with a preliminary base sublimation from graphite electrodes makes up 10-5-10-7 wt.% depending on impurity nature

Additional details

Additional titles

Original title (Russian)
Химико-атомно-эмиссионный анализ высокочистого XeF

Publishing Information

Journal Title
Vysokochistye Veshchestva
Journal Issue
no.6
Series
Vysokochist. Veshchestva.
ISSN
0235-0122
CODEN
VYVEE

INIS

Country of Publication
Russian Federation
Country of Input or Organization
USSR
INIS RN
23056971
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
ACCURACY; EMISSION SPECTROSCOPY; IMPURITIES; QUANTITATIVE CHEMICAL ANALYSIS; SENSITIVITY; XENON FLUORIDES
Descriptors DEC
CHEMICAL ANALYSIS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; RARE GAS COMPOUNDS; SPECTROSCOPY; XENON COMPOUNDS